Lithium isotope evidence for light element decoupling in the Panama subarc mantle

Geology ◽  
2000 ◽  
Vol 28 (6) ◽  
pp. 507-510 ◽  
Author(s):  
Paul B. Tomascak ◽  
Jeffrey G. Ryan ◽  
Marc J. Defant
Geology ◽  
2000 ◽  
Vol 28 (6) ◽  
pp. 507 ◽  
Author(s):  
Paul B. Tomascak ◽  
Jeffrey G. Ryan ◽  
Marc J. Defant

2017 ◽  
Vol 91 (1) ◽  
pp. 363-364
Author(s):  
Licheng WANG ◽  
Chenglin LIU ◽  
Chunlian WANG ◽  
Haiming XU ◽  
Yongming ZHANG

Elements ◽  
2020 ◽  
Vol 16 (4) ◽  
pp. 253-258 ◽  
Author(s):  
Philip A.E. Pogge von Strandmann ◽  
Simone A. Kasemann ◽  
Josh B. Wimpenny

Lithium and its isotopes can provide information on continental silicate weathering, which is the primary natural drawdown process of atmospheric CO2 and a major control on climate. Lithium isotopes themselves can help our understanding of weathering, via globally important processes such as clay formation and cation retention. Both these processes occur as part of weathering in modern surface environments, such as rivers, soil pore waters, and groundwaters, but Li isotopes can also be used to track weathering changes across major climate-change events. Lithium isotope evidence from several past climatic warming and cooling episodes shows that weathering processes respond rapidly to changes in temperature, meaning that weathering is capable of bringing climate back under control within a few tens of thousands of years.


Nature ◽  
2006 ◽  
Vol 443 (7111) ◽  
pp. 565-568 ◽  
Author(s):  
Tim Elliott ◽  
Alex Thomas ◽  
Alistair Jeffcoate ◽  
Yaoling Niu

2015 ◽  
Vol 432 ◽  
pp. 210-222 ◽  
Author(s):  
Maria Lechler ◽  
Philip A.E. Pogge von Strandmann ◽  
Hugh C. Jenkyns ◽  
Giacomo Prosser ◽  
Mariano Parente

2021 ◽  
Vol 7 (42) ◽  
Author(s):  
Philip A. E. Pogge von Strandmann ◽  
Morgan T. Jones ◽  
A. Joshua West ◽  
Melissa J. Murphy ◽  
Ella W. Stokke ◽  
...  

2013 ◽  
Vol 6 (8) ◽  
pp. 668-672 ◽  
Author(s):  
Philip A. E. Pogge von Strandmann ◽  
Hugh C. Jenkyns ◽  
Richard G. Woodfine

Author(s):  
G.F. Bastin ◽  
H.J.M. Heijligers ◽  
J.M. Dijkstra

For the calculation of X-ray intensities emitted by elements present in multi-layer systems it is vital to have an accurate knowledge of the x-ray ionization vs. mass-depth (ϕ(ρz)) curves as a function of accelerating voltage and atomic number of films and substrate. Once this knowledge is available the way is open to the analysis of thin films in which both the thicknesses as well as the compositions can usually be determined simultaneously.Our bulk matrix correction “PROZA” with its proven excellent performance for a wide variety of applications (e.g., ultra-light element analysis, extremes in accelerating voltage) has been used as the basis for the development of the software package discussed here. The PROZA program is based on our own modifications of the surface-centred Gaussian ϕ(ρz) model, originally introduced by Packwood and Brown. For its extension towards thin film applications it is required to know how the 4 Gaussian parameters α, β, γ and ϕ(o) for each element in each of the films are affected by the film thickness and the presence of other layers and the substrate.


Author(s):  
Nestor J. Zaluzec

The application of electron energy loss spectroscopy (EELS) to light element analysis is rapidly becoming an important aspect of the microcharacterization of solids in materials science, however relatively stringent requirements exist on the specimen thickness under which one can obtain EELS data due to the adverse effects of multiple inelastic scattering.1,2 This study was initiated to determine the limitations on quantitative analysis of EELS data due to specimen thickness.


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